INDUSTRIAL AUTOMATION

Next-Gen Contact Image Sensors: Compact Solutions for Battery and Print Inspection

Contact Image Sensors (CIS) have undergone significant advancements, transforming from their origins in consumer electronics into highly capable tools for machine vision applications. The latest generation offers increased speed, higher resolution, and improved dynamic range, making them ideal for spatially constrained environments like battery production lines and printing systems.

In this article, we will explore how these sensors are addressing the unique challenges of modern manufacturing, from lithium-ion battery production to high-accuracy print inspection. We’ll also discuss their compact design, integration advantages, and emerging applications that highlight their versatility in today’s fast-paced industrial landscape.

Revolutionizing Lithium-Ion Battery Production with CIS:

The global shift toward clean energy and electric vehicles (EVs) has driven an unprecedented demand for lithium-ion batteries (LiBs). To meet this demand, manufacturers must scale production while maintaining exceptional quality. This is where Contact Image Sensors excel.

Key Applications in Battery Manufacturing

CIS technology plays a pivotal role in the electrode manufacturing process of LiBs. Tasks such as coating, calendering, slitting, and packaging require high-speed and precise optical inspection. Here’s how CIS delivers:

  • Compact Design for Tight Spaces: CIS operates within a working distance of 10–20 mm, significantly smaller than conventional line scan cameras. This compact form factor fits seamlessly into constrained production environments.
  • High Resolution and Speed: Modern CIS modules offer up to 120 kHz line rates and 900 dpi resolution, enabling real-time quality control for defect detection and measurements.
  • Dynamic Range Imaging: CIS captures dark graphite materials on reflective copper foils with clarity, ensuring accurate inspections.
  • Integrated Design: Combining the camera, lens, and lighting into a single unit simplifies installation and reduces system complexity.

By utilizing CIS, manufacturers can inspect for pinholes, cracks, scratches, and thickness variations with unmatched precision, ensuring consistent product quality and minimizing waste.

Elevating Print Inspection with CIS

Print inspection demands high accuracy, especially for applications like label printing and packaging. The compact size of CIS systems offers distinct advantages over conventional vision systems.

Advancements in Print Inspection Technology

  1. True RGB Color Capture: The latest CIS modules feature trilinear CMOS sensors coated with dye-based RGB filters. These sensors deliver high-color fidelity and accurate defect detection for faint or subtle color variations.
  2. Automatic Spatial Correction: CIS modules automatically align the three color channels, ensuring seamless image capture without manual adjustments.
  3. Optimized Lighting: White LED light sources with tailored spectral characteristics enhance the detection of specific ink colors, improving overall inspection quality.
  4. Compact Integration: The all-in-one CIS design is ideal for small-scale print inspection systems where space and flexibility are limited.

These capabilities make CIS technology indispensable for ensuring quality in printed labels, packaging, and other materials where vibrant and consistent color reproduction is critical.

Image: Banknote image captured using CIS technology, highlighting the intricate security features and print quality.

Driving Throughput and Accuracy with Next-Gen CIS

In the realm of next-generation CIS technology, throughput and accuracy are driven by advancements in key specifications such as Modulation Transfer Function (MTF), measurement consistency, and standard deviation. To highlight the performance, let’s compare the measured MTF, mean values, and standard deviations for two different sensor configurations:

Table: Performance Comparison

28µm (900dpi)

42µm (600dpi)

MTF (target 45µm/line)

40.9%

27.6%

Measurement (target 500µm/line)

Mean value

501.2µm

504.8µm

Standard deviation

5.928µm

13.33µm

This table effectively showcases the differences in performance, with the 28µm (900dpi) configuration achieving higher MTF and better measurement consistency. The standard deviation is also lower, indicating more stable results when used for critical applications.

Image: Measured MTF, means, and standard deviation of black-and-white line pair targets.

In addition to the precision offered by the sensors, high dynamic range (HDR) imaging with a dual-line sensor is highly beneficial, especially when dealing with dark and reflective materials. This technology ensures that even challenging inspection scenarios are captured with clarity and detail, enabling better detection and quality control.

Image: High dynamic range (HDR) imaging with a dual line sensor is ideal for dark and reflective materials.

By incorporating these advanced capabilities, next-gen CIS systems significantly enhance throughput without compromising on the quality and accuracy of the inspection.

Metrology Benefits: Precision Without Compromise

CIS technology is increasingly used in metrology tasks that demand both precision and reliability. Unlike conventional sensors, CIS modules offer the following advantages:

  • Telecentric Self-Focus Lenses: These ensure distortion-free imaging and 1:1 optical magnification, essential for accurate measurements.
  • IP-Rated Designs: Dust protection ensures reliable performance in demanding inspection environments.
  • Eliminating Missing Pixels: Staggered architecture addresses pixel gaps, delivering seamless and reliable data for real-world applications.

These features make CIS technology a go-to solution for industries requiring exacting standards of measurement and defect detection.

The Future of CIS Technology

As industries push for greater precision, efficiency, and automation, CIS technology will continue to evolve. Emerging trends include:

  • Multispectral Imaging: This capability will enhance inspections for specialized materials.
  • Extended Working Distances: New designs will allow deeper depths of field and more versatile applications.
  • Advanced Lighting Techniques: Multifield lighting will improve defect detection and analysis in diverse environments.

With these advancements, CIS will remain at the forefront of innovation, offering solutions that meet the ever-growing demands of modern manufacturing.

Conclusion

From lithium-ion battery production to high-accuracy print inspection, Contact Image Sensors are redefining machine vision. Their compact design, high resolution, and integration-friendly features make them indispensable tools in industries where precision and efficiency are paramount.

As technology advances, CIS will continue to adapt, addressing new challenges and driving innovation in manufacturing. Whether you’re in clean energy or printing, adopting CIS technology can help you achieve unparalleled quality and operational excellence.